XXI CONFERENCE ON APPLIED CRYSTALLOGRAPHY
20 - 24 SEPTEMBER, 2009
Zakopane, Poland 2009
  1. Development of methods and techniques in the X-ray studies
    • quantitative analysis
    • crystal structure refinement by the Rietveld method
    • stress, strain and crystallite size determination
    • small angle scattering
    • texture and orientation distribution
  2. Crystal structure determination methods
  3. Crystallography of phase transformations
  4. Crystallography computing - software and data base
  5. Texture analysis of materials
  6. Material structures
    • metals and alloys
    • ceramics
    • polymers
    • thin films
    • quasicrystals
    • amorphous materials
    • nanomaterials
    • molecular crystals
    • structure of interfaces
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Main page University of Silesia Committee of Crystallography,
Committee of Material Science of Polish Academy of Sciences		 Dr Danuta Stróż